ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,445,709, issued on Oct. 14, was assigned to VIEWNETIC LTD. (Tel Aviv, Israel).
"Inspection system for use in monitoring plants in plant growth areas" was invented by David Scheiner (Savyion, Israel), Eilat Tal (D.N. Arava, Israel) and Hai Benron (Haifa, Israel).
According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection system is presented for use in monitoring plants' conditions in a plant growing area. The inspection system comprises: an optical probe comprising at least one imaging set, each imaging set comprising: a flash illuminator unit; an imaging unit configured with a predetermined resolution; and a sensing unit; the optical probe being configu...