US Patent Issued to UNITED STATES OF AMERICA AS REPRESENTED BY THE SECRETARY OF THE ARMY on May 13 for "Measuring deflection to determine a characteristic of a layered-material strip" (Illinois Inventors)

ALEXANDRIA, Va., June 12 -- United States Patent no. 12,298,264, issued on May 13, was assigned to UNITED STATES OF AMERICA AS REPRESENTED BY THE SECRETARY OF THE ARMY (Alexandria, Va.).

"Measuring deflection to determine a characteristic of a layered-material strip" was invented by Benjamin C Masters (Urbana, Ill.) and Rebekah C Wilson (Mahomet, Ill.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed are methods that, by not physically touching a material being measured, can measure the material's differential response quite accurately. A collimated light shines on the material under test is reflected off it, and is then captured by a device that records the position where the reflected light is captu...