US Patent Issued to United States of America as represented by the Administrator of NASA on July 8 for "Fourier ptychographic microscope systems and methods" (District Of Columbia Inventors)

ALEXANDRIA, Va., July 9 -- United States Patent no. 12,352,946, issued on July 8, was assigned to United States of America as represented by the Administrator of NASA (Washington).

"Fourier ptychographic microscope systems and methods" was invented by George Nehmetallah (Washington), Shahid Aslam (Washington) and Thuc Phan (Washington).

According to the abstract* released by the U.S. Patent & Trademark Office: "Imaging devices, methods, and systems are disclosed. The disclosure includes a Fourier Ptychographic Microscope ("FPM") compatible for integration to a Microfluidic Device ("MD") to perform wide Field-of-View ("FoV"), high spatial resolution imaging (greater than1 micro metre), for biosignature detection and motility in liquid samp...