US Patent Issued to United Semiconductor Japan on June 24 for "Probe position monitoring structure and method of monitoring position of probe" (Japanese Inventor)

ALEXANDRIA, Va., June 25 -- United States Patent no. 12,339,315, issued on June 24, was assigned to United Semiconductor Japan Co. Ltd. (Kuwana, Japan).

"Probe position monitoring structure and method of monitoring position of probe" was invented by Yasunobu Torii (Kuwana, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A probe position monitoring structure includes a first common line, a second common line, a contact portion configured, and a reference zigzag structure. The contact portion includes a first zigzag structure, a second zigzag structure, a third zigzag structure, and a fourth zigzag structure. A first end of the first zigzag structure, a first end of the fourth zigzag structure, and a firs...