ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,443,178, issued on Oct. 14, was assigned to United Semiconductor (Xiamen) Co. Ltd. (Fujian, China).
"Machine monitoring system and machine monitoring method" was invented by Qun Feng Liu (Shamen, China), Fujin Wang (Singapore), Kai Ping Huang (Tainan, Taiwan) and Wen Yi Tan (Fujian, China).
According to the abstract* released by the U.S. Patent & Trademark Office: "A machine monitoring system includes a plurality of first machines and a control module. The first machines are for a first process. The control module is connected with the first machines. The control module is configured to: define each of the first machines as a high-risk first machine or a low-risk first machine accord...