ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,523,568, issued on Jan. 13, was assigned to Trioptics GmbH (Wedel, Germany).
"Device and method for measuring imaging properties of an optical system" was invented by Ralf Poikat (Wedel, Germany), Albert Milczarek (Wedel, Germany) and Frank Peter (Wedel, Germany).
According to the abstract* released by the U.S. Patent & Trademark Office: "A device for measuring imaging properties of an optical system including: a rigid holding device; and MTF measuring devices arranged at predefined positions of the holding device such that, by each of the MTF measuring devices, a modulation transfer function can be measured at respective different, predefinable, angular positions in the image field ...