ALEXANDRIA, Va., Nov. 25 -- United States Patent no. 12,481,076, issued on Nov. 25, was assigned to TibaRay Inc. (Santa Clara, Calif.).
"Beam monitor and methods of use" was invented by Sami Tantawi (Stanford, Calif.), Luyao Xu (Santa Clara, Calif.) and Filippos Toufexis (Redwood City, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "Beam monitors, methods of use and fabrication are provided herein. Beam monitors can include a rounded beam cavity with one or more waveguide connected thereto, from which a signal can be used to determine one or more beam characteristics. Such monitors can include a beam intensity monitor that includes a cylindrical beam cavity with a rectangular waveguide extending from a...