US Patent Issued to Tianjin University on March 18 for "Method for in-situ measurement of temperature at microwave-induced microscopic hot spots, temperature measuring particles and the device used" (Chinese Inventors)

ALEXANDRIA, Va., March 19 -- United States Patent no. 12,253,418, issued on March 18, was assigned to Tianjin University (Tianjin, China).

"Method for in-situ measurement of temperature at microwave-induced microscopic hot spots, temperature measuring particles and the device used" was invented by Xin Gao (Tianjin, China), Zhenyu Zhao (Tianjin, China) and Hong Li (Tianjin, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for in situ measurement of temperature at microwave-induced microscopic hot spots, temperature measuring particles and the device used are provided. For the temperature measurement demand of the microscopic hot spot of microwave field, loading fluorescent temperature measuring p...