ALEXANDRIA, Va., June 16 -- United States Patent no. 12,308,222, issued on May 20, was assigned to THE BOARD OF TRUSTEES OF THE UNIVERSITY OF ILLINOIS (Urbana, Ill.).
"Subspace approach to accelerate Fourier transform mass spectrometry imaging" was invented by Fan Lam (Champaign, Ill.), Jonathan V. Sweedler (Urbana, Ill.) and Yuxuan Xie (Champaign, Ill.).
According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, apparatus, and storage medium for obtaining high-resolution mass spectra and chemical maps from a sample using a subspace Fourier transform mass spectrometry (FT-MS) approach are described. The method includes conducting a first set of image data corresponding to a first group of spatial positions on the...