US Patent Issued to SYSMEX, NATIONAL UNIVERSITY CORPORATION KYOTO INSTITUTE OF TECHNOLOGY on Sept. 30 for "Ion sensor and method for measuring ions" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,429,451, issued on Sept. 30, was assigned to SYSMEX Corp. (Kobe, Japan) and NATIONAL UNIVERSITY CORPORATION KYOTO INSTITUTE OF TECHNOLOGY (Kyoto, Japan).

"Ion sensor and method for measuring ions" was invented by Junko Kojima (Kobe, Japan), Kenichi Uchiyama (Kobe, Japan) and Yumi Yoshida (Kyoto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "The ion sensor of the present invention is a current measurement type ion sensor that measures a current to measure a target ion, and includes an organic phase retaining layer containing an organic phase capable of forming an interface with the sample containing the target ion, a first electrode to which the ...