US Patent Issued to Sintokogio on Nov. 25 for "Method for manufacturing reference piece for x-ray measurement of residual stress and reference piece for x-ray measurement of residual stress" (Japanese Inventors)

ALEXANDRIA, Va., Nov. 25 -- United States Patent no. 12,480,894, issued on Nov. 25, was assigned to Sintokogio Ltd. (Nagoya, Japan).

"Method for manufacturing reference piece for x-ray measurement of residual stress and reference piece for x-ray measurement of residual stress" was invented by Yuji Kobayashi (Toyokawa, Japan), Akinori Matsui (Toyokawa, Japan) and Yuta Saito (Toyokawa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A metal material other than strain-free iron powder can be used as a reference piece for X-ray measurement of residual stress. The metal material is manufactured by nanocrystallizing at least a portion of a surface of a metal material, and then removing inherent strain by anne...