ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,442,757, issued on Oct. 14, was assigned to Sintokogio Ltd. (Nagoya, Japan) and National University Corporation TOYOHASHI UNIVERSITY OF TECHNOLOGY (Toyohashi, Japan).

"Gas measuring device and gas measuring method" was invented by Manase Mizutani (Nagoya, Japan), Toshihiko Noda (Toyohashi, Japan) and Kazuaki Sawada (Toyohashi, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A gas measuring device includes a gas chamber into which a sample gas containing a target gas is introduced, a gas detection unit configured to detect the target gas contained in the sample gas introduced into the gas chamber, an irradiation unit configured to apply polarized li...