ALEXANDRIA, Va., April 2 -- United States Patent no. 12,266,100, issued on April 1, was assigned to SIEMENS HEALTHINEERS AG (Forchheim, Germany).

"Generating X-ray image data on the basis of a weighting of basis materials varying depending on location" was invented by Bernhard Schmidt (Fuerth, Germany) and Thomas Allmendinger (Forchheim, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "An imaging method is described for generating image data of an examination region of an object that is to be examined. First X-ray projection measurement data of the examination region is acquired using a first X-ray energy spectrum and at least second X-ray projection measurement data of the examination region is acquir...