US Patent Issued to SHANDONG UNIVERSITY, WEIHAI RESEARCH INSTITUTE OF INDUSTRIAL TECHNOLOGY OF SHANDONG UNIVERSITY on May 27 for "Coincidence technique-based x-ray detection device and composition analysis method" (Chinese Inventors)

ALEXANDRIA, Va., June 17 -- United States Patent no. 12,313,574, issued on May 27, was assigned to SHANDONG UNIVERSITY (Weihai, China) and WEIHAI RESEARCH INSTITUTE OF INDUSTRIAL TECHNOLOGY OF SHANDONG UNIVERSITY (Weihai, China).

"Coincidence technique-based x-ray detection device and composition analysis method" was invented by Chen Liu (Weihai, China), Shouyu Wang (Weihai, China), Guangzhi Li (Weihai, China), Yong Wang (Weihai, China) and Bingying Xia (Weihai, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A coincidence technique-based X-ray detection device and composition analysis method are provided, wherein the X-ray detection device includes: a sample holding device; an excitation unit for outpu...