US Patent Issued to Northwestern University on July 15 for "High resolution two-dimensional resistance tomography" (Illinois, Wisconsin, Colorado, New Jersey Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,357,188, issued on July 15, was assigned to Northwestern University (Evanston, Ill.).

"High resolution two-dimensional resistance tomography" was invented by Matthew Allen Grayson (Evanston, Ill.), Chulin Wang (Evanston, Ill.), Claire Cecelia Onsager (Stoughton, Wis.), Can Cenap Aygen (Chicago), Charles M. Costakis (Evanston, Ill.), Lauren E. Lang (Boulder, Colo.), Andreas Tzavelis (Demarest, N.J.) and John Ashley Rogers (Wilmette, Ill.).

According to the abstract* released by the U.S. Patent & Trademark Office: "The disclosed 2-D and 3-D tomographic resistance imaging method improves tomographic resistance image resolution by adopting an orthogonal basis with the maximum number of e...