ALEXANDRIA, Va., July 9 -- United States Patent no. 12,354,007, issued on July 8, was assigned to NORTH UNIVERSITY OF CHINA (Taiyuan, China).
"Artificial intelligence (AI)-based method for non-contact measurement of sheet resistance of a conductive film material" was invented by Yaqing Liu (Taiyuan, China), Guanyu Han (Taiyuan, China) and Guizhe Zhao (Taiyuan, China).
According to the abstract* released by the U.S. Patent & Trademark Office: "An artificial intelligence (AI)-based method for non-contact measurement of sheet resistance of a conductive film material, in which a non-contact measurement method commonly used in the field of electromagnetic wave absorbing-materials is adopted to measure reflection loss data of a wave-absorbing s...