US Patent Issued to NEC on Aug. 12 for "Node equipment, wavelength monitor, and wavelength monitoring method" (Japanese Inventor)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,388,555, issued on Aug. 12, was assigned to NEC Corp. (Tokyo).

"Node equipment, wavelength monitor, and wavelength monitoring method" was invented by Morihiko Ota (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A first WSS performs demultiplexes a first wavelength-multiplexed optical signal, outputs part of the wavelengths to a first path, and outputs a remaining wavelength to a second path. A first spectrum analyzer observes a spectrum of a first optical signal included in the first wavelength-multiplexed optical signal and a spectrum of a second optical signal output from the first WSS and outputs a first observational result. A second WSS outpu...