US Patent Issued to NATIONAL UNIVERSITY CORPORATION NAGAOKA UNIVERSITY OF TECHNOLOGY, OPT GATE on Nov. 25 for "Optical measurement apparatus" (Japanese Inventors)

ALEXANDRIA, Va., Nov. 25 -- United States Patent no. 12,480,866, issued on Nov. 25, was assigned to NATIONAL UNIVERSITY CORPORATION NAGAOKA UNIVERSITY OF TECHNOLOGY (Nagaoka, Japan) and OPT GATE Co. LTD. (Tokyo).

"Optical measurement apparatus" was invented by Moritsugu Sakamoto (Niigata, Japan), Hiroshi Ono (Niigata, Japan), Kohei Noda (Niigata, Japan) and Masayuki Tanaka (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is an optical measurement apparatus including: a polarized light irradiation unit 10 that irradiates a subject Ob with irradiation light of which polarization is controlled; and a polarization imaging unit 20 that images a polarization state of measurement light occurring due t...