US Patent Issued to National Institute of Metrology, China, Sun Yat-Sen University on Jan. 13 for "Energy spectrum-dose measuring method and device" (Chinese Inventors)

ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,523,789, issued on Jan. 13, was assigned to National Institute of Metrology, China (Beijing) and Sun Yat-Sen University (Guangzhou, China).

"Energy spectrum-dose measuring method and device" was invented by Jianwei Huang (Beijing), Dehong Li (Beijing), Lei Cao (Guangzhou, China), Xuan Zhang (Beijing), Xiaole Zhang (Beijing), Yaofeng Zhang (Beijing), Chuanfeng Liu (Beijing), Jian Zhang (Beijing), Zhan Liu (Beijing) and Yang Yang (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "An energy spectrum-dose measuring method and device is provided. The method includes: performing energy calibration on a spectrometer using a standard radiation source to ob...