US Patent Issued to NANJING UNIVERSITY OF AERONAUTICS AND ASTRONAUTICS, SUZHOU RESEARCH INSTITUTE OF NANJING UNIVERSITY OF AERONAUTICS AND ASTRONAUTICS on May 20 for "Methods for image simulation, pseudo-random defect dataset generation, and micro and nano defects detection" (Chinese Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,307,654, issued on May 20, was assigned to NANJING UNIVERSITY OF AERONAUTICS AND ASTRONAUTICS (Nanjing, China) and SUZHOU RESEARCH INSTITUTE OF NANJING UNIVERSITY OF AERONAUTICS AND ASTRONAUTICS (Suzhou, China).

"Methods for image simulation, pseudo-random defect dataset generation, and micro and nano defects detection" was invented by Kai Meng (Nanjing, China), Junquan Zhou (Nanjing, China), Hangying Zhang (Nanjing, China), Chao Meng (Nanjing, China), Peihuang Lou (Suzhou, China), Xiaoming Qian (Nanjing, China) and Xing Wu (Nanjing, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "The embodiments of the present disclosure provide a method for an im...