US Patent Issued to Mitsubishi Electric on Oct. 28 for "Inspection device for optical semiconductor device configured to correct positions of the plurality of lead terminals" (Japanese Inventor)

ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,455,312, issued on Oct. 28, was assigned to Mitsubishi Electric Corp. (Tokyo).

"Inspection device for optical semiconductor device configured to correct positions of the plurality of lead terminals" was invented by Tomohito Taniuchi (Nagasaki, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A plurality of electrodes (13) are provided on tip ends of a plurality of blocks (8) respectively. The plurality of lead terminals (3) are sandwiched by the plurality of blocks (8) and the plurality of wires (9) to correct positions of the plurality of lead terminals (3). The plurality of electrodes (13) are brought into contact with the plurality of lead termin...