US Patent Issued to Micron Technology on April 15 for "Apparatus for determination of capacitive and resistive characteristics of access lines" (American, Chinese Inventors)

ALEXANDRIA, Va., June 5 -- United States Patent no. 12,276,686, issued on April 15, was assigned to Micron Technology Inc. (Boise, Idaho).

"Apparatus for determination of capacitive and resistive characteristics of access lines" was invented by Dan Xu (Sunnyvale, Calif.), Jun Xu (Shanghai) and Erwin E. Yu (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Apparatus having an array of memory cells and a controller for access of the array of memory cells, wherein the controller is configured to cause the apparatus to apply a reference current to a selected access line, determine a time difference between a voltage level of a near end of the selected access line being deemed to exceed a first volt...