US Patent Issued to Mettler-Toledo (Changzhou) Precision Instruments, Mettler-Toledo (Changzhou) Measurement Technology, Mettler Toledo International Trading (Shanghai) on June 17 for "Method for configuring a calibration mechanism and force sensor thereof" (Chinese Inventors)

ALEXANDRIA, Va., June 19 -- United States Patent no. 12,332,109, issued on June 17, was assigned to Mettler-Toledo (Changzhou) Precision Instruments Ltd. (Changzhou, China), Mettler-Toledo (Changzhou) Measurement Technology Ltd. (Changzhou, China) and Mettler Toledo International Trading (Shanghai) Co. Ltd (Shanghai).

"Method for configuring a calibration mechanism and force sensor thereof" was invented by Lei Xu (Changzhou, China), Jean Christophe Emery (Shanghai) and Li Yang (Changzhou, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for configuring a calibration mechanism in a force sensor (100) has the steps of: coupling an end of the calibration lever (1071) to a loading end (102) of the f...