US Patent Issued to Mettler-Toledo (Changzhou) Precision Instruments, Mettler Toledo (Changzhou) Measurement Technology, Mettler-Toledo International Trading (Shanghai) on April 15 for "Method and device for diagnosing weighing system" (Chinese Inventors)

ALEXANDRIA, Va., June 5 -- United States Patent no. 12,276,539, issued on April 15, was assigned to Mettler-Toledo (Changzhou) Precision Instruments Ltd (Changzhou, China), Mettler Toledo (Changzhou) Measurement Technology Ltd. (Changzhou, China) and Mettler-Toledo International Trading (Shanghai) Co. Ltd. (Shanghai).

"Method and device for diagnosing weighing system" was invented by Jianqiang Yang (Changzhou, China), Lifeng Cai (Changzhou, China) and Jianwei Wu (Changzhou, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method and device are provided for diagnosing a weighing system. In the method, the weighing system acquires an intrinsic parameter, a status parameter, and an operating parameter of ...