US Patent Issued to Mettler-Toledo (Changzhou) Measurement Technology, Mettler-Toledo (Changzhou) Precision Instruments, Mettler-Toledo International Trading (Shanghai) on Nov. 25 for "Hanging scale sensor apparatus and a hanging scale" (German, Chinese Inventors)

ALEXANDRIA, Va., Nov. 25 -- United States Patent no. 12,480,804, issued on Nov. 25, was assigned to Mettler-Toledo (Changzhou) Measurement Technology Ltd. (Changzhou, China), Mettler-Toledo (Changzhou) Precision Instruments Ltd. (Changzhou, China) and Mettler-Toledo International Trading (Shanghai) Co. Ltd. (Shanghai).

"Hanging scale sensor apparatus and a hanging scale" was invented by Naiqing Cao (Changzhou, China), Edgar Kempf (Inzigkofen, Germany) and Dieter Kontschak (Winterlingen, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A hanging scale sensor apparatus and hanging scale are disclosed. The hanging scale sensor apparatus includes an adapter beam connected to one end of a bottom face of a w...