ALEXANDRIA, Va., Oct. 8 -- United States Patent no. 12,433,515, issued on Oct. 7, was assigned to MEDTRONIC MINIMED INC. (Northridge, Calif.).

"Dry electrochemical impedance spectroscopy metrology for conductive chemical layers" was invented by Chi-En Lin (Encino, Calif.), Akhil Srinivasan (Woodland Hills, Calif.), David L. Probst (Chandler, Ariz.), Melissa Tsang (Los Angeles), Mohsen Askarinya (Chandler, Ariz.), Riley Clayton Kimball (Tempe, Ariz.), Robert McKinlay (West Hills, Calif.), Vu Nguyen (Chandler, Ariz.), Wally Dong (Chandler, Ariz.), Xin Heng (Glendale, Calif.) and Brennan Toshner (Northridge, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of testing one or more analyte sensors ea...