US Patent Issued to MARVELL ASIA on May 27 for "Method, system and device of serializing and de-serializing the delivery of scan test data through chip I/O to reduce the scan test duration of an integrated circuit" (California Inventors)

ALEXANDRIA, Va., June 17 -- United States Patent no. 12,313,682, issued on May 27, was assigned to MARVELL ASIA PTE LTD. (Singapore).

"Method, system and device of serializing and de-serializing the delivery of scan test data through chip I/O to reduce the scan test duration of an integrated circuit" was invented by Sounil Biswas (San Jose, Calif.), Amit Wangoo (Cupertino, Calif.) and Zhanwei Zhong (Milpitas, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "An integrated circuit verification system including automatic test equipment (ATE) and a device under test (DUT) having an internal test data de-serializer and test response data serializer. Specifically, the de-serializer of the DUT is able to de-se...