ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,465,294, issued on Nov. 11, was assigned to KONINKLIJKE PHILIPS N.V. (Eindhoven, Netherlands).
"Local spectral-covariance or local spectral covariance deficits computation and display for highlighting of relevant material transitions in spectral CT and MR" was invented by Rafael Wiemker (Kisdorf, Germany), Liran Goshen (Pardes-Hanna, Israel), Hannes Nickisch (Hamburg, Germany), Claas Bontus (Hamburg, Germany), Tom Brosch (Hamburg, Germany), Jochen Peters (Norderstedt, Germany) and Rolf Jurgen Weese (Norderstedt, Germany).
According to the abstract* released by the U.S. Patent & Trademark Office: "The present invention relates to multispectral imaging. In order to improve an identific...