ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,386,798, issued on Aug. 12, was assigned to Institute of Geology and Geophysics, Chinese Academy of Sciences (Beijing).
"Method and system for intelligent removal of multi-dimensional logging data outliers" was invented by Fei Tian (Beijing), Qingyun Di (Beijing), Wenhao Zheng (Beijing), Yongyou Yang (Beijing) and Wenjing Cao (Beijing).
According to the abstract* released by the U.S. Patent & Trademark Office: "The present invention is in the field of geological measurement, and particularly relates to a method and system for intelligent removal of multi-dimensional logging data outliers, aiming to solve the problem that it is difficult to achieve stable parameter acquisition in the ...