US Patent Issued to Honeywell International on Jan. 20 for "Integrated quality monitoring view for battery manufacturing process" (Indian Inventors)

ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,529,660, issued on Jan. 20, was assigned to Honeywell International Inc. (Charlotte, N.C.).

"Integrated quality monitoring view for battery manufacturing process" was invented by Anjali Chandran (Cochin, India), Hrishikesh Thakre (Nagpur, India), Senthilkumar Jayaraman (Mettur, India), Ajaykumar Bangur (Bangalore, India), Ajay Krishna (Lucknow, India) and Bharath Kumar M G (Bangalore, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "Integrated quality monitoring techniques enable a plant operator to simultaneously view and analyze data that are derived from a plurality of sensors. An apparatus for and a method of inferring quality of a sheet roll co...