US Patent Issued to HITACHI on March 18 for "Beam monitoring system, particle therapy system, and beam monitoring method" (Japanese Inventors)

ALEXANDRIA, Va., March 19 -- United States Patent no. 12,251,578, issued on March 18, was assigned to HITACHI LTD. (Tokyo).

"Beam monitoring system, particle therapy system, and beam monitoring method" was invented by Kota Sasaki (Tokyo), Kouichi Okada (Tokyo) and Yuichiro Ueno (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An object of the present invention is to increase sensitivity and position resolution of measurement of an arrival position of a charged particle beam irradiated during treatment. A beam monitoring system includes: a gamma ray detector that detects gamma rays generated by interaction between a charged particle beam and an irradiation target; a shield that is disposed between the ga...