US Patent Issued to Hitachi High-Tech, National Institute of Advanced Industrial Science and Technology on May 27 for "Sample holder, intermembrane distance adjustment mechanism, and charged particle beam device" (Japanese Inventors)

ALEXANDRIA, Va., June 17 -- United States Patent no. 12,315,695, issued on May 27, was assigned to Hitachi High-Tech Corp. (Tokyo) and National Institute of Advanced Industrial Science and Technology (Tokyo).

"Sample holder, intermembrane distance adjustment mechanism, and charged particle beam device" was invented by Michio Hatano (Tokyo), Mitsuhiro Nakamura (Tokyo) and Toshihiko Ogura (Tsukuba, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A sample holder reliably holds a liquid or gel sample, and the yield of observation with a charged particle beam device is improved. A sample holder 101 includes a first member 102 that has a lid member 111 and a first chip 105 provided with a first window 123 whe...