US Patent Issued to Hefei Institutes of Physical Science, CAS on Jan. 13 for "Device for accurately measuring bending strain of superconducting strand" (Chinese Inventors)

ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,523,585, issued on Jan. 13, was assigned to Hefei Institutes of Physical Science, CAS (Hefei, China).

"Device for accurately measuring bending strain of superconducting strand" was invented by Yu Wu (Hefei, China), Yunhao Liu (Hefei, China), Peng Gao (Hefei, China), Chao Dai (Hefei, China) and Zichuan Guo (Hefei, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A device for accurately measuring bending strain of a superconducting strand is provided. The bending strain precision measuring device includes a support frame. A driving mechanism is installed on the upper part of the support frame. An output end of the driving mechanism is sequentially con...