US Patent Issued to COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES on July 15 for "System for correlating alpha and gamma spectrometry measurements for in situ radiological characterisation of a sample" (French Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,360,264, issued on July 15, was assigned to COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES (Paris).

"System for correlating alpha and gamma spectrometry measurements for in situ radiological characterisation of a sample" was invented by Julien Venara (Pujaut, France), Deborah Degrelle (Caderousse, France), Mehdi Ben Mosbah (Saint Tulle, France) and Marc Leconte (Orange, France).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system is provided for correlating gamma spectrometry measurements and alpha spectrometry measurements of a same sample comprising radionuclides. The system includes at least a gamma detector able to provide gamma sp...