US Patent Issued to Collectors Universe on Aug. 26 for "Methods and apparatus to analyze an image of a portion of an item for a patternindicating authenticity of the item" (Japanese, American Inventors)

ALEXANDRIA, Va., Aug. 26 -- United States Patent no. 12,400,462, issued on Aug. 26, was assigned to Collectors Universe Inc. (Santa Ana, Calif.).

"Methods and apparatus to analyze an image of a portion of an item for a patternindicating authenticity of the item" was invented by Hideto Oda (Tokyo) and Dan Van Tran (Bedminster, N.J.).

According to the abstract* released by the U.S. Patent & Trademark Office: "In an embodiment, a method includes receiving a plurality of images having a plurality of image types. The method further includes, for each image type from the plurality of image types and to generate a plurality of subsets of images, identifying a subset of images from the plurality of images being that image type using an image clas...