US Patent Issued to City University of Hong Kong on June 10 for "Quantum meta-device for ultrasensitive displacement metrology" (Chinese Inventors)

ALEXANDRIA, Va., June 18 -- United States Patent no. 12,326,665, issued on June 10, was assigned to City University of Hong Kong (Kowloon, Hong Kong).

"Quantum meta-device for ultrasensitive displacement metrology" was invented by Yubin Fan (Kowloon, Hong Kong), Mu Ku Chen (Kowloon, Hong Kong) and Din Ping Tsai (Kowloon, Hong Kong).

According to the abstract* released by the U.S. Patent & Trademark Office: "Displacement measurement systems, measurement methods and EUV lithography machines for quantum meta-structure elements are disclosed, which include: an entangled state light source generator, a meta-device, a collimating lens, a polarizing beam splitter, and a computing section. Left-rotation photon and the right-rotation photon are pr...