US Patent Issued to China Electronic Product Reliability And Environmental Testing Research Institute on June 24 for "Method for monitoring degradation mechanism of switch device in power conversion circuit" (Chinese Inventors)

ALEXANDRIA, Va., June 25 -- United States Patent no. 12,339,310, issued on June 24, was assigned to China Electronic Product Reliability And Environmental Testing Research Institute (Guangzhou, China).

"Method for monitoring degradation mechanism of switch device in power conversion circuit" was invented by Yiqiang Chen (Guangzhou, China), Haofan Long (Guangzhou, China), Bo Hou (Guangzhou, China) and Changjian Zhou (Guangzhou, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "In a method for monitoring a degradation mechanism of a switch device in a power conversion circuit. When individually determining the degradation mechanism of internal defects of the switch device, it is determined through a change ...