US Patent Issued to China Electronic Product Reliability and Environmental Testing Research Institute ((The Fifth Electronic Research Institute of Ministry of Industry and Information Technology) (CEPREI)) on Dec. 9 for "Parallel accelerated test method and apparatus that separately applies multiple sensitive stresses to multiple components" (Chinese Inventors)

ALEXANDRIA, Va., Dec. 9 -- United States Patent no. 12,493,070, issued on Dec. 9, was assigned to China Electronic Product Reliability and Environmental Testing Research Institute ((The Fifth Electronic Research Institute of Ministry of Industry and Information Technology) (CEPREI)) (Guangdong, China).

"Parallel accelerated test method and apparatus that separately applies multiple sensitive stresses to multiple components" was invented by Guangze Pan (Guangzhou, China), Qian Li (Guangzhou, China), Xiaobing Li (Guangzhou, China), Baimao Lei (Guangzhou, China), Xianghong Hu (Guangzhou, China), Debin Cheng (Guangzhou, China), Qin Luo (Guangzhou, China), Zigang Cai (Guangzhou, China), Dan Li (Guangzhou, China), Fangfei Liu (Guangzhou, China) ...