US Patent Issued to CHINA AUTOMOTIVE TECHNOLOGY AND RESEARCH CENTER, CHINA AUTOMOTIVE CHIP (SHENZHEN) TECHNOLOGY on Nov. 18 for "High-temporal-accuracy power glitch fault injection method and apparatus for cryptographic chip" (Chinese Inventors)

ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,475,010, issued on Nov. 18, was assigned to CHINA AUTOMOTIVE TECHNOLOGY AND RESEARCH CENTER Co. LTD. (Tianjin, China) and CHINA AUTOMOTIVE CHIP (SHENZHEN) TECHNOLOGY Co. LTD. (Shenzhen, China).

"High-temporal-accuracy power glitch fault injection method and apparatus for cryptographic chip" was invented by Xianzhao Xia (Tianjin, China), Yuning Li (Tianjin, China), Mingyang Li (Tianjin, China), Yujia Li (Tianjin, China), Yaozong Xu (Tianjin, China), Rui Zhao (Tianjin, China), Ruiqing Zhai (Tianjin, China), Mingkai Yan (Tianjin, China), Changqing Dong (Tianjin, China), Hui Rong (Tianjin, China) and Lixiong Zhang (Tianjin, China).

According to the abstract* released by the U.S. Patent &...