US Patent Issued to Analog Devices International UnLtd. on July 15 for "Data quality monitoring across isolation" (Japanese, British, American, Irish, German Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,362,476, issued on July 15, was assigned to Analog Devices International UnLtd. Co. (Limerick, Ireland).

"Data quality monitoring across isolation" was invented by Iku Nagai (Setagaya-ku, Japan), Baoxing Chen (Westford, Mass.), Jonathan Ephraim David Hurwitz (Edinburgh, Great Britain), Hidetoshi Takagi (Katori, Japan), Paul Kearney (Cork City, Ireland) and Andreas Koch (Wiesbaden, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A digital isolator includes a receiver configured to receive digital raw data at a primary side of the digital isolator. A digital-to-digital encoder is disposed at the primary side of the digital isolator. The digital-to-...