US Patent Issued on Sept. 30 for "Method and apparatus for noninvasive absolute (mean) intracranial pressure (A-ICP) measurement and/or monitoring" (Israeli Inventors)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,426,849, issued on Sept. 30.

"Method and apparatus for noninvasive absolute (mean) intracranial pressure (A-ICP) measurement and/or monitoring" was invented by David Michaeli (Ashkelon, Israel) and Menashe Michaeli (Ashkelon, Israel).

According to the abstract* released by the U.S. Patent & Trademark Office: "Non-invasive measurement of intracranial pressure (ICP), for example mean ICP. A probe adjacent the head emits energy, such as ultrasound, and receives reflected signals. A processing unit derives ICP waveform from the signals. A pressure mechanism applies external pressure intermittently to outer surface of the head and incrementally increases the external pressure. The proces...