INTERNATIONAL PATENT: ZTE CORPORATION, 中兴通讯股份有限公司 FILES APPLICATION FOR "MEMORY LEAK DETECTION METHOD AND APPARATUS, ELECTRONIC DEVICE AND READABLE STORAGE MEDIUM"

GENEVA, Feb. 2 -- ZTE CORPORATION (ZTE Plaza, Keji Road South, Hi-Tech Industrial Park, Nanshan District,Shenzhen, Guangdong 518057), 中兴通讯股份有限公司 (中国广东省深圳市南山区高新技术产业园科技南路中兴通讯大厦) filed a patent application (PCT/CN2024/077612) for "MEMORY LEAK DETECTION METHOD AND APPARATUS, ELECTRONIC DEVICE AND READABLE STORAGE MEDIUM" on Feb 19, 2024. With publication no. WO/2025/020508, the details related to the patent application was published on Jan 30, 2025.

Notably, the patent application w...