INTERNATIONAL PATENT: ZJU-HANGZHOU GLOBAL SCIENTIFIC AND TECHNOLOGICAL INNOVATION CENTER, 浙江大学杭州国际科创中心 FILES APPLICATION FOR "TRANSMISSION ELECTRON MICROSCOPE SAMPLE ROD AND SAMPLE TESTING METHOD"

GENEVA, March 8 -- ZJU-HANGZHOU GLOBAL SCIENTIFIC AND TECHNOLOGICAL INNOVATION CENTER (No. 733, Jianshe 3rd Road, Xiaoshan DistrictHangzhou, Zhejiang 311215), 浙江大学杭州国际科创中心 (中国浙江省杭州市萧山区建设三路733号) filed a patent application (PCT/CN2023/121528) for "TRANSMISSION ELECTRON MICROSCOPE SAMPLE ROD AND SAMPLE TESTING METHOD" on Sep 26, 2023. With publication no. WO/2025/043796, the details related to the patent application was published on Mar 06, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system,...