INTERNATIONAL PATENT: ZING SEMICONDUCTOR CORPORATION, 上海新昇半导体科技有限公司, SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY, CHINESE ACADEMY OF SCIENCES, 中国科学院上海微系统与信息技术研究所 FILES APPLICATION FOR "SILICON CRYSTAL, SILICON CRYSTAL DEFECT TREATMENT METHOD AND DEFECT CHARACTERIZATION METHOD"

GENEVA, April 18 -- ZING SEMICONDUCTOR CORPORATION (No. 1000, Yunshui Road, Nicheng TownPudong New Area, Shanghai 201306), 上海新昇半导体科技有限公司 (中国上海市浦东新区泥城镇云水路1000号), SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY, CHINESE ACADEMY OF SCIENCES (865 Changning RoadChangning District, Shanghai 200050), 中国科学院上海微系统与信息技术研究所 (中国上海市长宁区长宁路865&#...