GENEVA, Dec. 1 -- YAMAHA FINE TECHNOLOGIES CO.,LTD. (283, Aoya-cho, Chuo-ku, Hamamatsu-shi, Shizuoka4358568), ヤマハファインテック株式会社 (静岡県浜松市中央区青屋町２８３番地) filed a patent application (PCT/JP2025/018799) for "INSPECTION METHOD, INSPECTION DEVICE, AND INSPECTION SYSTEM" on May 23, 2025. With publication no. WO/2025/244136, the details related to the patent application was published on Nov 27, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intelle...