INTERNATIONAL PATENT: WELCON INC., 株式会社ＷＥＬＣＯＮ, TOKYO ELECTRON LIMITED, 東京エレクトロン株式会社 FILES APPLICATION FOR "CHUCK, PROBER HAVING SAME AND WAFER TEST SYSTEM"

GENEVA, Sept. 2 -- WELCON INC. (3640 Yashiroda, Akiha-ku, Niigata-shi, Niigata9560113), 株式会社ＷＥＬＣＯＮ (新潟県新潟市秋葉区矢代田３６４０番地), TOKYO ELECTRON LIMITED (3-1 Akasaka 5-chome, Minato-ku, Tokyo1076325), 東京エレクトロン株式会社 (東京都港区赤坂五丁目３番１号) filed a patent application (PCT/JP2025/002629) for "CHUCK, PROBER HAVING SAME, AND WAFER TEST SYSTEM" on Jan 28, 2025. With publication no. WO/2025/17...