GENEVA, June 24 -- TOWA CORPORATION (5, Kamitoba Kamichoshi-cho, Minami-ku, Kyoto-shi, Kyoto6018105), ＴＯＷＡ株式会社 (京都府京都市南区上鳥羽上調子町５番地) filed a patent application (PCT/JP2024/028193) for "INSPECTION SYSTEM, SEMICONDUCTOR MANUFACTURING DEVICE, AND INSPECTION METHOD" on Aug 07, 2024. With publication no. WO/2025/126563, the details related to the patent application was published on Jun 19, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WI...