GENEVA, April 7 -- TOPPAN HOLDINGS INC. (5-1, Taito 1-chome, Taito-ku, Tokyo1100016), ＴＯＰＰＡＮホールディングス株式会社 (東京都台東区台東１丁目５番１号) filed a patent application (PCT/JP2024/034349) for "INSPECTION DEVICE AND INSPECTION METHOD" on Sep 26, 2024. With publication no. WO/2025/070573, the details related to the patent application was published on Apr 03, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization ...