INTERNATIONAL PATENT: TOPCON CORPORATION, KO, TONY, WEI, XIANG, AKIBA, MASAHIRO, KUO, JEN-WEI, JAFARI, REZA, SPAIDE, RICHARD FILES APPLICATION FOR "OPTICAL COHERENCE TOMOGRAPHY SPECKLE VELOCIMETRY"

GENEVA, Nov. 12 -- TOPCON CORPORATION (75-1 Hasunuma-cho, Itabashi-kuTokyo, Tokyo 174-8580), KO, Tony (1673 Galway DriveCupertino, California 95014), WEI, Xiang (175 Calvert Drive Apt S204Cupertino, California 95014), AKIBA, Masahiro (c/o TOPCON CORPORATION75-1, Hasunuma-cho, Itabashi-kuTokyo, Tokyo 174-8580), KUO, Jen-Wei (10 Brandon AveLivingston, New Jersey 07039), JAFARI, Reza (4 Manchester CourtKinnelon, New Jersey 07405), SPAIDE, Richard (15 W. 72nd Street, 17ENew York, New York 10023) filed a patent application (PCT/US2025/027468) for "OPTICAL COHERENCE TOMOGRAPHY SPECKLE VELOCIMETRY" on May 02, 2025. With publication no. WO/2025/231347, the details related to the patent application was published on Nov 06, 2025.

Notably, the patent...