INTERNATIONAL PATENT: TMEIC CORPORATION, 株式会社ＴＭＥＩＣ FILES APPLICATION FOR "CONTOUR DETECTION DEVICE AND SHAPE MEASUREMENT DEVICE"

GENEVA, Nov. 10 -- TMEIC CORPORATION (3-1-1, Kyobashi, Chuo-ku, Tokyo1040031), 株式会社ＴＭＥＩＣ (東京都中央区京橋三丁目１番１号) filed a patent application (PCT/JP2024/016707) for "CONTOUR DETECTION DEVICE AND SHAPE MEASUREMENT DEVICE" on Apr 30, 2024. With publication no. WO/2025/229722, the details related to the patent application was published on Nov 06, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): MANABE, Tsubasa (c/o TMEIC CORPORATION, 3-1...